Fraunhofer Center for Silicon Photovoltaics CSP

Based on many years of experience in the field of metrology for photovoltaics, Fraunhofer CSP develops innovative measurement methods and devices that are used for laboratory as well as for outdoor applications. The metrology solutions are designed at an early stage together with industrial partners and tested as prototypes. The necessary know-how is often protected by patent applications and can be used by users through license agreements.